Solar Panel EL Inspection System for Daylight PV Testing
Daylight EL Tester
Perform EL inspection under daylight conditions with high-sensitivity infrared imaging, automatic focusing, AI-assisted defect recognition, and programmable EL power control.
Product Overview
Unlike conventional EL testing methods that typically rely on nighttime operation or controlled dark environments, the system is designed to perform EL inspection under daylight conditions.
High-sensitivity infrared imaging and optical light-shielding technology help reduce interference from sunlight, allowing PV modules to be inspected in strong outdoor light without constructing temporary shading facilities.
The system supports PV string-level inspection for 1500 V-class photovoltaic applications and can also be used for conventional nighttime EL testing.
Key Features & Benefits
Daylight EL Inspection
Perform electroluminescence inspection directly under daylight conditions without waiting for nighttime plant shutdown or constructing temporary shading facilities.
40 MP High-Sensitivity Imaging
A 40-megapixel scientific-grade high-sensitivity CMOS system provides detailed EL images for identifying micro-cracks, broken fingers, cell fractures, and other internal PV module defects.
1500 V PV Testing
The programmable EL power supply supports output up to 1500 V for mainstream high-voltage photovoltaic string applications.
Automatic Continuous Focus
The integrated automatic focusing system helps maintain consistent image quality during field inspection and reduces the need for repeated manual adjustment.
Programmable EL Power Supply
Programmable voltage and current control provides stable electrical excitation for EL imaging while incorporating multiple protection functions for field operation.
AI Defect Recognition
AI-assisted software automatically analyzes EL images and supports defect recognition, marking, classification, and inspection report generation.
Daylight Video Scanning
The system supports video scanning for daylight EL inspection, providing a flexible imaging method for large-area PV field inspection.
Automated Inspection Reports
Inspection images and analysis results can be organized by project and used to generate standardized EL inspection reports.
EL Testing Without Waiting for Nighttime
Daylight EL Inspection
Traditional EL inspection can require nighttime operation, temporary shading, or other measures to reduce ambient light interference. The Daylight EL Tester is designed to perform EL imaging directly under daylight conditions, providing a more flexible approach for PV plant inspection.
Conventional EL Inspection
Step 1
🌙 Nighttime Operation
Inspection is typically scheduled during nighttime conditions.
↓
Step 2
Temporary Shading
Ambient light may require temporary shading or controlled inspection conditions.
↓
Step 3
PV String EL Imaging
↓
Step 4
Manual Analysis
Daylight EL Inspection
☀️ Daylight Operation
Perform EL inspection directly under daylight conditions.
↓
PV String EL Imaging
Capture EL images using high-sensitivity infrared imaging.
↓
AI-Assisted Analysis
Automatically analyze and identify EL-visible defects.
↓
Inspection Report
Organize inspection results and generate inspection reports.
No temporary shading structure. No need to wait for nighttime plant shutdown.
Typical Applications
Utility-Scale PV Plants
EL inspection during commissioning, acceptance testing, quality assessment, and maintenance of large photovoltaic plants.
PV Module Quality Inspection
Identify internal module defects and abnormal EL patterns during incoming inspection, sampling, quality verification, and troubleshooting.
Rooftop & Commercial PV Systems
Suitable for EL inspection of industrial, commercial, and rooftop photovoltaic installations.
Complex PV Plant Environments
The system can be used in a wide range of PV plant environments, including ground-mounted, mountainous, hillside, agricultural-solar, floating-solar, rooftop, and other installations.
Detectable Defects
Identify internal photovoltaic module defects before they lead to performance degradation.
Micro Crack
Broken Finger
Black / Dark Spots
Regular Scratch
Irregular Scratch
Edge Contamination
Imaging System
|
Parameter
|
Specification
|
|---|---|
|
Camera Resolution |
40 MP |
|
Imaging Resolution |
7360 × 4912 |
|
Sensor |
Scientific-Grade High-Sensitivity CMOS |
|
Infrared Sensor |
Germanium Infrared Sensor |
|
Infrared Lens |
High-Sensitivity Infrared Lens |
|
Focus System |
Automatic Continuous Focus |
|
Cell-Level Imaging Accuracy |
0.1 mm/pixel |
|
Module-Level Imaging Accuracy |
0.3 mm/pixel |
|
Daylight EL Imaging |
Supported |
|
Video Scanning |
Supported |
|
Detection Speed |
0.1–60 s adjustable |
|
Fastest Imaging Speed |
1 s |
|
High-Definition Crack Imaging |
1–12 modules |
|
Attenuation Imaging |
1–32 modules |
EL Power Supply Specifications
|
Parameter
|
Specification
|
|---|---|
|
Output Voltage |
0–1500 V / 0–100 V |
|
Supported Module Types |
0–20 A |
|
Detectable Defects |
±0.1% |
|
Focus System |
±1% |
|
Camera Control |
30 kW / 2 kW |
|
Image Storage |
±0.05% |
|
Image Export |
100 ms |
|
Wireless Communication |
220 VAC / 380 VAC |
|
Operating Modes |
50/60 Hz |
|
Mounting Platform |
Supported |
|
Inspection Environment |
Supported |
|
Power Supply |
Supported |
|
Software Functions |
Supported |
Software
|
Function
|
Specification
|
|---|---|
|
Wireless Device Control |
Supported |
|
AI Defect Recognition |
Supported |
|
AI Gray-Level Analysis |
Supported |
|
Automatic Image Correction |
Supported |
|
Project Management |
Supported |
|
Automatic Report Generation |
Supported |
|
Cloud Data Synchronization |
Supported |
|
Interface |
Chinese / English |
SUPPORT & INFORMATION
Daylight EL Tester – FAQ
Find answers about EL inspection capability, software functions, testing conditions, and portable field applications.